WEBINAR: THE EXPERT GUIDE TO LEAF AREA INDEX—THEORY, METHODS, AND APPLICATION

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Leaf Area Index (LAI) has vast implications across land use management, ecology, and any project impacted by gross primary productivity (GPP). But multiple measurement methods make the process of choosing the best method for your application confusing. How do you balance accuracy and labor efforts?  In this 30-minute webinar, METER’s Product Manager for plant, canopy, and atmospheric monitoring, Jeff Ritter, will discuss: What is LAI and why measure it, direct sampling methods, including litter traps, indirect ground-based methods, including hemispherical photography, the difference between transmittance and reflectance methods, satellite-based approaches, and how to choose the right method for your project that balances precision and labor intensity. 
 
PRESENTER 
Jeff Ritter is the Product Manager for plant, canopy, and atmospheric monitoring instrumentation here at METER. He earned his master’s degree in plant physiology from Washington State University, where his research focused on leaf-level gas exchange, and the impact of plant biochemistry on the measurement of the global carbon cycle. Prior to working at METER, he held a research faculty position at Washington State University in the Department of Crop and Soil Sciences. 

 

 

Register for the live event

February 27th, 9am PST

All registrants will receive a recording in their email after the live event.

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